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PROCESS CAPABILITIES

Description

Standard

Advanced

PANEL SIZE

Panel Size

12in x18in (304mmx457mm)

12inx18in (304mmx457mm)

Materials

Plated Copper

2um-70um Thick

2um-70um Thick

Polyimide

12.5um-125um Thick

12.5um-70um Thick

Sheet Adhesives

Mod Acrylic, PSA, Mod Polyimide

Mod Acrylic, PSA, Mod Polyimide

Coverlayer

          Film

12um PI/12umADH-75umPI/75umADH

12umPI/12umADH-75umPI/75um

          Photo imageable

25um,37um,50um,62um

25um,37um,50um,62um

Stiffener

FR4, Polyimide,

FR4, Polyimide,Non-Ferrous metal

Photo Imaging (LDI)

Single and Double sided

3-5µm Cu min (L/S)

20µm-25µm

10µm-20µm

12µm Cu min (L/S)

30µm-35µm 

20µm-25µm

18µm Cu min (L/S)

40µm-50µm 

30µm-45µm

35µm Cu min (L/S) 

55µm-65µm 

40µm-55µm

Layer to Layer Registration

<75um

<30um

Smallest Feature

20um 

10-15um

DFSM 

25um,37um,50um,62um 

25um,37um,50um 62um

Unsupported Flying Lead Width 

50um 

37um

Multilayer Flex Imaging (LDI)

Number of active layers 

1-3 layers 

Up to 6 layers

Layer to layer registration 

<75 um 

<30um

Via Type 

Through 

Through / Blind/ Buried

Microvias

Size 

32um 

25um

Positional Accuracy 

35um 

25um

Layers 

1-3 Layers 

Up to 6 layers

Plating

Electroless Copper 

>32um Vias 

>25um Vias

Electrolytic Nickel 

As required 

As Required

Electrolytic Copper

 As Required

As Required

Electrolytic Soft Gold

 As Required

As Required

Immersion Gold 

0.6um 

0.6 um

ENIG 

As Required 

As Required

Dielectric Patterning

CO2 Laser 

Yes

Yes

Plasma Etch

Yes

Yes

Chemical

Yes

Yes

Sputtering

Materials

Polyimide 

Polyimide

Metals 

Various (Ti/Au/Cu/Cr) 

Various (Ti/Au/Cu/Cr)

Singulation

Steel Ruled Die 

125um 

100um

CNC Precision punch

         Positional Tolerance 

35um

 20um

         Smallest Feature

 150um 

100um

         Positional Tolerance 

37um 

25um

Laser Profiling UV/CO² 

35um 

25um

Quality

Visual Inspection

 Yes 

Yes

AOI

 Yes 

Yes

Automated Repair Station

 Yes 

Yes

Electrical Test (Flying Probe)

 Yes 

Yes

XRF

 Yes 

Yes

Automated Optical Measurement

 Yes 

Yes

Ionic Contamination

 Yes 

Yes

  • Depends on Design Constraints. Please contact Serflex engineering for more information

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